JR88115 Senior Engineer - CMOS & Metallization Test Structure Design and Layout

Relocation Level

TBD

Responsibilities

• Support process development activities through memory cell-based test structure solutions by actively engaging with Process Integration, Product and Design, Electrical Characterization, Advanced Mask Development and Design Rule teams.
• Interpret electrical DUT (Device under Test) definition and build completed Test Element Groups (TEGs) with high confidence functionality on silicon.
• Implement novel solutions as the need arises to study failure mechanisms and monitor the health of silicon.
• Assist with parametric correlation and debug to ensure build accuracy.
• Verify and validate test structure documentation and related parametric information.

Minimum Qualifications

• Bachelor of Science in Electrical or Microelectronic Engineering with 5 years of experience.