Drive E2E yield improvement initiatives across FE wafer fabrication, probe, assembly, and final test through deep data analysis and technical insight, with primary ownership from a Central YE perspective.
Lead global yield analytics and learning loops, connecting FE process data, electrical/parametric test results, and AT test outcomes to rapidly identify root causes and improvement opportunities.
Define and execute yield strategies to ensure FE process readiness and robustness are fully aligned and qualified to support downstream AT performance and overall product yield.
Serve as a technical integrator across FE–AT boundaries, working with cross‑functional teams to close gaps in yield, quality, and test coverage.
Champion standardization of yield analysis methodologies, dashboards, and business processes across the Micron network, leveraging best‑known methods (BKM) and benchmarking internal and external in...